Determination of elastic moduli of elastic–plastic microspherical materials using nanoindentation simulation without mechanical polishing

• Hongzhou Li and
• Jialian Chen

Beilstein J. Nanotechnol. 2021, 12, 213–221, doi:10.3762/bjnano.12.17

• area of the indenter at a specified depth. These effects can result in measurement errors of mechanical properties [9]. Without taking into account that the real contact area and the cross-sectional area of the indenter are different, the measured indentation modulus/hardness would be too high in the

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• Guanajuato. Ex Hacienda San Matías s/n C.P. 36020. Guanajuato, Guanajuato, México 10.3762/bjnano.11.58 Abstract In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model

• that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip

• instrumentation requirements and higher frequency resolution at different resonant modes. Also, more than one vibrational mode in each measurement step as well as indentation modulus mappings are obtained. This is possible when system theory [21] is taken into account, i.e., the system identification problem [22

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• been carried out using CR-AFM for subsurface imaging, its application in defect diagnosis for flexible circuits has seldom been reported. Intuitively, the presence of buried metal circuit patterns in the tip-generated stress field will alter the local indentation modulus. This consequently leads to

• elastic half-space sample as illustrated in Figure 1b is too complicated for a simple analytical solution. Many efforts have been tried to solve this kind of contact problem. The contact stiffness and the equivalent indentation modulus are usually calculated via approximated approaches [29][30], empirical

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

• M. Kalyan Phani,
• Anish Kumar,
• T. Jayakumar,
• Walter Arnold and
• Konrad Samwer

Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79

• cantilever with damped flexural modes. The cantilever dynamics model considering damping, which was proposed recently, has been used for mapping of indentation modulus and damping of different phases in a metallic structural material. The study indicated that in a Ti-6Al-4V alloy the metastable β phase has

• acoustic microscopy; contact resonances; damping; indentation modulus; Ti-6Al-4V; Introduction The physical and mechanical properties of the individual phases govern the respective properties of the multiphase structural materials. The knowledge of elastic properties of the individual phases is important

• successfully mapped the indentation modulus of α- and β-phases in a Ti-6Al-4V alloy by using AFAM while using a cantilever dynamic model in which damping, however, was neglected. In this paper, we report mapping of elastic modulus and damping using a modified cantilever dynamic model in various phases, such as

Nanometer-resolved mechanical properties around GaN crystal surface steps

• Jörg Buchwald,
• Marina Sarmanova,
• Bernd Rauschenbach and
• Stefan G. Mayr

Beilstein J. Nanotechnol. 2014, 5, 2164–2170, doi:10.3762/bjnano.5.225

• presented by Vlassak and Nix [20], who connected the indentation modulus to the Barnett–Lothe tensors for anisotropic materials [21]. For the one-atom indentation, (Figure 3), M behaves similarly to stress fluctuations with better convergence below the step and a similar decrease in the elastic constants on

• a FEM model (Figure 5) in which surface stresses were omitted. The indentation modulus was calculated by evaluating the contact stiffness S = dF/du of the stationary solution. The flatpunch indenter was modeled by a cylinder of hard material with a contact area A2 and a force of |F|= −Fz = 30 nN as

• these results to the molecular dynamics simulation with the same radius (Figure 4), a similar behavior for the indentation modulus could be found. However, there was an even more pronounced increase for y < 0 that was also dependent on the step height, in contrast to our MD simulations results

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

• ]. This approach uses relations that were derived by Sneddon [8] in order to extract the indentation modulus from the slope of the unloading curve according to Equation 1 [23][24] where S is stiffness, given by the slope dF/dh of the unloading curve, and A the contact area between the indenter and the